Research Group

Mo Huang, Yan Lu, Xiao-ming Xiong, Seng-Pan U, R. P. Martins, An All-Factor Modulation Bandwidth Extension Technique for Delta-Sigma PLL Transmitter

IEEE Region 10 Conference (TENCON)

pp. 1-4. Professional Award Nov-2015

YangWen Wang, Man-Chung Wong, Chi-Seng Lam, Historical review of hybrid active power filter for power quality improvement

The IEEE Region 10 Conference (TENCON 2015)

Macau, China, pp. 1 – 6. Nov-2015

Jingjing Sheng, Ning-Yi Dai, Man-Chung Wong, Chi-Seng Lam, Keng-Weng Lao, Droop-boost control for single-phase hybrid power filter

The IEEE Region 10 Conference (TENCON 2015)

Macau, China, pp. 1 – 6 Nov-2015

Wen-Ming Zheng, Chi-Seng Lam, Sai Weng Sin, Yan Lu, Man-Chung Wong, Seng-Pan U, R. P. Martins, Capacitive floating level shifter: Modeling and design

IEEE Region 10 Conference (TENCON)

Macau, China, pp. 1-6 Nov-2015

Yan Zhu, Chi Hang Chan, U-Fat Chio, Sai Weng Sin, Seng-Pan U, R. P. Martins, Split-SAR ADCs: Improved Linearity with Power and Speed Optimization

", IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Vol.22, Issue: 2 , pp 372 - 383 Feb-2014

Yanwei Jia, L. J. Wangh, J. A. Sanchez, J. Rice, Detecting Nucleic Acid Variations within Populations of Genomes

Granted Number: 9169514

US Patent

Oct-2015

Ka-Meng Lei, Pui In Mak, Man-Kay Law, R. P. Martins, A thermal-insensitive all-electronic modular µNMR relaxometer with a 2D digital microfluidic chip for sample management

International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS)

pp.302-304 Oct-2015

Ka-Meng Lei, Student/Young Researcher Grant
 

the Chemical and Biological Microsystems Society (2015)

Oct-2015

Yanwei Jia, J. A. Sanchez, J. Rice, L. J. Wangh, Methods and Kits for Detecting Nucleic Acid Mutants in Wild-Type Populations

Granted Number: 20160040242

US Patent

Oct-2015

Zushu Yan, Pui In Mak, Man-Kay Law, R. P. Martins, Franco Maloberti, Nested-Current-Mirror Rail-to-Rail-Output Single-Stage Amplifier With Enhancements of DC Gain, GBW and Slew Rate

IEEE Journal of Solid-State Circuits

vol. 50, pp. 2353-2366 Oct-2015