Fabrication Process
EDA Tools
IT Facilities
Measurement Equipments

Fabrication Process

  • 28-nm CMOS
  • 40-nm CMOS
  • 65-nm CMOS
  • 0.18-µm CMOS
  • 0.13-µm CMOS
  • 90-nm CMOS
  • 0.35-µm CMOS

EDA Tools

  • System-level/behavioral modeling and simulation: C++, MATLAB, SIMULINK and SWITCAP2
  • Cadence frameworks: Analog Artist
  • IC schematic entry: Cadence Virtuoso Schematic Composer
  • IC simulators: APS, Spectre, SpectreS, SpectreRF, NC-Verilog, NC-VHDL, Ultrasim, NC-Sim, NanoSim, HSPICE/AvanWaves, Modelsim, PSPICE
  • Logic Designs: Encounter Test, Encounter Library Characterizer, Encounter RTL Compiler
  • IC layout: Virtuoso Layout Editor, SOC Encounter
  • IC physical verifications (DRC, LVS, RCX): Mentor-Graphic Calibre, ASSURA, QRC Extraction, Synopsys Hercules, Star-RCXT
  • PCB design tools: Protel
  • Measurement signal acquisition tools: LabVIEW
  • Distributed computing: Sun Grid Engine
  • General-purpose: Microsoft Windows and Office, Unix and Linux

IT Facilities

  • Over 40 High Performance 12+ CPU Server
  • 40G High Speed Switch for backbone network
  • 80TB Cluster Network Storage System

Measurement Equipments

  • Digitally Tunable Bandpass System
  • E8257D PSG Analog Signal Generator
  • 6629A System DC Power Supply
  • E3614 DC Power Supply
  • E8663D Analog Signal Generator
  • DSA90254A Digital Signal Analyzer
  • N8974A Noise Figure Analyzer
  • ESPEC SH-261 Bench Top Type Temperature & Humidity Chamber
  • 50GHz N9030A PXA Signal Analyzer 50GHz
  • 44GHz E8267D PSG Vector Signal Generator
  • 4294A Impedance Analyzer
  • PCR Real-Time PCR Detection System
  • Motorized Upright Microscope (Fluorescence)
  • Cascade PM5 Probe Station
  • Signatone Probe Station
  • Eagle Xtreme GoCu Au Wire Bonder
  • Semiconductor Device Analyzer

(over 50 measurement equipments …..)

Measurement Equipment of Analog-to-Digital Converter (Overview) and (Performance Evaluation)


Experimental Setup for EVM measurement (64QAM OFDM)