The Distinguished Lecture on “Capacitively-Biased BJT-Based Temperature Sensors and Bandgap References in CMOS Process” will take place as follows:
Date: 03 October 2024 (Thursday)
Time: 11:00 a.m. – 12:00 p.m.
Venue: Research Building N21, G/F, Room G013
The speaker is:
Dr. TANG zhong, Analog IC Design Manager, Vango Technologies Inc.
The Lecture is:
Capacitively-Biased BJT-Based Temperature Sensors and Bandgap References in CMOS Process
Abstract:
As basic analog blocks, BJTs/Diodes biased with static current sources can generate PTAT and CTAT signals, which are widely used to build temperature sensors and bandgap references in CMOS processes. Despite their high accuracy and reliability, they typically require an over-1V supply voltage, which may limit their applications in advanced CMOS processes, where a sub-1V supply is preferred. Furthermore, their over-1V supply and static power also limit the energy efficiency in IoT applications. To further reduce the supply while maintaining high accuracy, the capacitively-biased diode (CBD) technique was recently proposed. Instead of using static current sources, BJTs/diodes can also be biased by pre-charged capacitors, which require a lower voltage headroom and consume only dynamic power. In this talk, the speaker will present the research on CMOS temperature sensors based on the CBD technique. Protype designs in different process nodes from 180 nm to 22 nm show the process scalability of this technique. Moreover, thanks to the all-dynamic property, an analog-to-digital converter (ADC) with an embedded bandgap reference using this technique can scale its power consumption and bandwidth flexibly without degrading its accuracy.
Biography:
Dr. TANG zhong is an Analog IC Design Manager with Vango Technologies Inc., Hangzhou, China. He received his B.S. and Ph.D. degrees in electrical engineering from Zhejiang University, Hangzhou, China, in 2015 and 2020, respectively. From 2019 to 2020, he was a Visiting Scholar with EEIC Group, Eindhoven University of Technology, Eindhoven, The Netherlands. From 2020 to 2023, he was a Postdoc Researcher at Electronic Instrumentation Lab, Delft University of Technology, Delft, The Netherlands.
His research interests include precision analog and mixed-signal integrated circuits. He has authored or coauthored over 30 technical articles, including 7 from the IEEE International Solid-State Circuits Conference (ISSCC) and 5 from the IEEE Journal of Solid-State Circuits (JSSC). Dr. TANG was a recipient of the Chinese Institute of Electronics (CIE) Outstanding Doctoral Dissertation in 2022, and the Best Speaker Award of Workshop on IC Advances in China (ICAC) 2024.
For more details, kindly find the event poster, abstract and bio.
