成就

Cheng Dong, Yanwei Jia, Tianlan Chen, Jie Gao, Liang Wan, Pui In Mak, Mang I Vai, R. P. Martins, Precise Droplet Splitting on Digital Microfluidic Chip with Blade Structures”,

MicroTAS

Dublin, Ireland Oct-2016

Dante Gabriel Muratore, Alper Akdikmen, Edoardo Bonizzoni, Franco Maloberti, U-Fat Chio, Sai Weng Sin, R. P. Martins, An 8-bit 0.7-GS/s Single Channel Flash-SAR ADC in 65-nm CMOS Technology

. IEEE European Solid-State Circuits Conference – ESSCIRC 2016

pp. 421-424 Sep-2016

Jianyu Zhong, Yan Zhu, Chi Hang Chan, Sai Weng Sin, Seng-Pan U, R. P. Martins, A 12b 180MS/s 0.068mm2 Pipelined-SAR ADC with Merged-residue DAC for Noise Reduction

IEEE European Solid-State Circuits Conference – ESSCIRC 2016

pp. 169-172 Sep-2016

Mo Huang, Yan Lu, Sai Weng Sin, Seng-Pan U, R. P. Martins, Wing-Hung Ki, Limit Cycle Oscillation Reduction for Digital Low Dropout Regulators

IEEE Transactions on Circuits and Systems II

Volume:63 , Issue: 9 , pp.903-907 Sep-2016

Junmin Jiang, Yan Lu, Wing-Hung Ki, A Digitally-Controlled 2-/3-Phase 6-Ratio Switched-Capacitor DC-DC Converter with Adaptive Ripple Reduction and Efficiency Improvements

IEEE European Solid-State Circuits Conference (ESSCIRC)

Sep-2016

Pui In Mak, Zhicheng Lin, R. P. Martins, Ultra-Low-Voltage Current-Reuse Voltage-Controlled Oscillator and Transconductance-Capacitor Filter

Granted Number: 9444431

US Patent

Sep-2016

Ka-Meng Lei, Pui In Mak, Man-Kay Law, R. P. Martins, CMOS Biosensors for In Vitro Diagnosis – Transducing Mechanisms and Applications

RSC Lab on a Chip

2016, 16, pp. 3664-3681 Sep-2016

Jiu Jiang Wang, Sio Hang Pun, Peng Un Mak, Ching-Hsiang Cheng, Yuanyu Yu, Pui In Mak, Improved Analytical Modeling of Membrane Large Deflection with Lateral Force for the Underwater CMUT Based on Von Kármán Equations

IEEE Sensors Journal

vol. 16, Issue: 17, pp. 6633-6640 Sep-2016

Wei-Han Yu, STGA Award

IEEE ISSCC

8 月-2016

Yan Lu, Cheng Li, Yan Zhu, Mo Huang, Seng-Pan U, R. P. Martins, A 312 ps Response-Time LDO with Enhanced Super Source Follower in 28 nm CMOS

Electronics Letters

Volume: 52, Issue: 16, pp.1368 - 1370 Aug-2016