成就

Yan Lu, Haojuan Dai, Mo Huang, Man-Kay Law, Sai Weng Sin, Seng-Pan U, R. P. Martins, A Wide Input Range Dual-Path CMOS Rectifier for RF Energy Harvesting

IEEE Transactions on Circuits and Systems II

Volume: 64, Issue: 2, pp.166 - 170 Feb-2017

Yan Lu, Mo Huang, Lin Cheng, Wing-Hung Ki, Seng-Pan U, R. P. Martins, A Dual-Output Wireless Power Transfer System with Active Rectifier and Three-Level Operation

IEEE Transactions on Power Electronics

Volume: 32, Issue: 2, pp.927 - 930 Feb-2017

Cheng Dong, Yanwei Jia, Jie Gao, Tianlan Chen, Pui In Mak, Mang I Vai, R. P. Martins, A 3D microblade structure for precise and parallel droplet splitting on digital microfluidic chips

Lab on a Chip

17, 896-904 Feb-2017

Lei Wang, Chi-Seng Lam, Man-Chung Wong, Unbalanced control strategy for a thyristor controlled LC-coupling hybrid active power filter in three-phase three-wire systems

IEEE Transactions on Power Electronics

vol. 32, Issue. 2, pp. 1056–1069 Feb-2017

Ka-Meng Lei, 2016 青年研究者奖

International Institute of Macau – IIM

Feb-2017

Ka-Meng Lei, Hadi Heidari, Pui In Mak, Man-Kay Law, Franco Maloberti, R. P. Martins, A Handheld High-Sensitivity Micro-NMR CMOS Platform with B-Field Stabilization for Multi-Type Biological/Chemical Assays

IEEE Journal of Solid-State Circuits

vol. 52,Issue 1, pp. 284-297 Jan-2017

Ka-Meng Lei, Hadi Heidari, Pui In Mak, Man-Kay Law, Franco Maloberti, R. P. Martins, A Handheld High Sensitivity Micro-NMR CMOS Platform with B-Field Stabilization for Multi-Type Biological/Chemical Assays

IEEE Journal of Solid-State Circuit

vol. 52, no. 1, pp. 284-297 [Invited Paper] Jan-2017

Arshad Hussain, Sai Weng Sin, Chi Hang Chan, Seng-Pan U, Franco Maloberti, R. P. Martins, Active-Passive ΔΣ Modulator for High-Resolution and Low-Power Applications

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

vol. 25, Issue. 1, pp. 364 – 374 Jan-2017

Yan Zhu, Chi Hang Chan, Seng-Pan U, R. P. Martins, A 10-bit 500-MS/s Partial-Interleaving Pipelined SAR ADC With Offset and Reference Mismatch Calibrations

in IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Vol: 25, Issue1, pp. 354-363 Jan-2017